Radiation Effects Research

• Space and Terrestrial Cosmic Rays Environment Characterization
• Single Event Effects (SEE) on Microelectronic Devices & Space Vehicles including:
• JEDEC 89 Soft Error Rate (SER) & Failure in Time (FIT) Testing
• New Microelectronics Beta Testing
• Alpha, Heavy Ion, Neutron, Total Dose and Dose Rate Gamma Testing
• Test on Demand DeliveredTM (TODD) Agile Test Systems
• Custom Microelectronics Design and Turnkey Testing
• Space Qualified Environmental Testing
• Turnkey Failure Analysis of Microelectronics using Radiation Emission Microscopy (REM)